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Proceedings Paper

Thin film transistors based on single-walled carbon nanotubes-polyethylenimine bilayer film for NO2 gas detection
Author(s): Tao Xie; Guangzhong Xie; Yong Zhou; Junlong Huang; Huiling Tai
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Paper Abstract

In this paper, bottom contact organic thin film transistors (OTFTs) using SiO2 dielectric layer deposited on silicon wafer were fabricated for gas sensors application. Single-walled carbon nanotubes (SWNTs)- polyethylenimine(PEI) bilayer sensitive film was utilized as an active layer to test current-voltage characteristics and gas-sensing properties of the OTFT device. Due to PEI coating, the electronic characteristic of the active layer was turned from p-type (SWNTs film) into n-type (SWNTs-PEI bilayer film). When the gas sensor was exposed to NO2 of different concentrations at room temperature, the source-drain current changed within several minutes at appropriate gate and source-drain voltages. The selectivity and repeatability of gas sensor were investigated as well. The results showed that the gas sensor exhibited outstanding properties to NO2 gas. Moreover, the gas sensing mechanism of the sensitive film associated with the morphology analyzed by scanning electron microscope (SEM) was studied.

Paper Details

Date Published: 21 August 2014
PDF: 7 pages
Proc. SPIE 9285, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials for Manufacturing and Testing, 92850A (21 August 2014); doi: 10.1117/12.2069584
Show Author Affiliations
Tao Xie, Univ. of Electronic Science and Technology of China (China)
Guangzhong Xie, Univ. of Electronic Science and Technology of China (China)
Yong Zhou, Univ. of Electronic Science and Technology of China (China)
Junlong Huang, Univ. of Electronic Science and Technology of China (China)
Huiling Tai, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 9285:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials for Manufacturing and Testing
Xiangang Luo; Harald Giessen, Editor(s)

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