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Proceedings Paper

Research of aerial camera focal pane micro-displacement measurement system based on Michelson interferometer
Author(s): Shu-juan Wang; Yu-liang Zhao; Shu-jun Li
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Paper Abstract

The aerial camera focal plane in the correct position is critical to the imaging quality. In order to adjust the aerial camera focal plane displacement caused in the process of maintenance, a new micro-displacement measuring system of aerial camera focal plane in view of the Michelson interferometer has been designed in this paper, which is based on the phase modulation principle, and uses the interference effect to realize the focal plane of the micro-displacement measurement. The system takes He-Ne laser as the light source, uses the Michelson interference mechanism to produce interference fringes, changes with the motion of the aerial camera focal plane interference fringes periodically, and records the periodicity of the change of the interference fringes to obtain the aerial camera plane displacement; Taking linear CCD and its driving system as the interference fringes picking up tool, relying on the frequency conversion and differentiating system, the system determines the moving direction of the focal plane. After data collecting, filtering, amplifying, threshold comparing, counting, CCD video signals of the interference fringes are sent into the computer processed automatically, and output the focal plane micro displacement results. As a result, the focal plane micro displacement can be measured automatically by this system. This system uses linear CCD as the interference fringes picking up tool, greatly improving the counting accuracy and eliminated the artificial counting error almost, improving the measurement accuracy of the system. The results of the experiments demonstrate that: the aerial camera focal plane displacement measurement accuracy is 0.2nm. While tests in the laboratory and flight show that aerial camera focal plane positioning is accurate and can satisfy the requirement of the aerial camera imaging.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822B (18 September 2014); doi: 10.1117/12.2069509
Show Author Affiliations
Shu-juan Wang, Naval Aeronautical Engineering Institute (China)
Yu-liang Zhao, Naval Aeronautical Engineering Institute (China)
Shu-jun Li, Naval Aeronautical Engineering Institute (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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