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Proceedings Paper

Research on tracking approach to weak small targets under sky background
Author(s): Jinling Chen; Dong Miao; Wensheng Zhou; Jiarui Shen; Nao Chen; Bo Kang
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Paper Abstract

The infrared (IR) target recognizing and tracking technique is widely applied to many fields such as industries, navigation, weapon controlling and guiding and so on. Its application in military field has become the research hotspot. The stability of target tracking is the most important in military applications. However, it is difficult to track the aerial target because of the complex background and noise interference, especially from long distance, which make tracking targets even harder. In this paper, a novel image tracking system is designed, which uses template matching algorithm combined with Kalman filter. Because of the noise in image, the presence of occlusion, and the deformation of tracked target, some tracking algorithms may fail. So it is the main idea in this paper to merge the advantages from the tracking algorithms, and track the target real time. The algorithm for weak small targets from the image is based on template matching algorithm. In order to overcome the problems related to the changes of unpredictable circumstance, Kalman filter tracking algorithm is used. For the disadvantage of template matching algorithm towards occasions in target tracking, such as target occlusion, drastic change of image intensity, the relevant solutions are proposed. In cases when the target is occluded or moves more than the operational limits of the tracking module, Kalman filter is used to predict the object location. Thus, automatic detection and tracking of target in real-time is achieved and the proposed method is more robust in target tracking. The results show that the algorithm can realize target tracking under complicated scenes. It also improves the tracking stability, capacity of anti-interfering and running efficiency.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928212 (18 September 2014); doi: 10.1117/12.2069499
Show Author Affiliations
Jinling Chen, Sichuan Jiuzhou Electric Group Co., Ltd. (China)
Dong Miao, Sichuan Jiuzhou Electric Group Co., Ltd. (China)
Wensheng Zhou, Sichuan Jiuzhou Electric Group Co., Ltd. (China)
Jiarui Shen, Sichuan Jiuzhou Electric Group Co., Ltd. (China)
Nao Chen, Sichuan Jiuzhou Electric Group Co., Ltd. (China)
Bo Kang, Sichuan Jiuzhou Electric Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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