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Proceedings Paper

Preparation and optimization of the laser thin film filter
Author(s): Jun-hong Su; Wei Wang; Jun-qi Xu; Yao-jin Cheng; Tao Wang
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Paper Abstract

A co-colored thin film device for laser-induced damage threshold test system is presented in this paper, to make the laser-induced damage threshold tester operating at 532nm and 1064nm band. Through TFC simulation software, a film system of high-reflection, high -transmittance, resistance to laser damage membrane is designed and optimized. Using thermal evaporation technique to plate film, the optical properties of the coating and performance of the laser-induced damage are tested, and the reflectance and transmittance and damage threshold are measured. The results show that, the measured parameters, the reflectance R ≥ 98%@532nm, the transmittance T ≥ 98%@1064nm, the laser-induced damage threshold LIDT ≥ 4.5J/cm2 , meet the design requirements, which lays the foundation of achieving laser-induced damage threshold multifunction tester.

Paper Details

Date Published: 6 August 2014
PDF: 6 pages
Proc. SPIE 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 928113 (6 August 2014); doi: 10.1117/12.2069371
Show Author Affiliations
Jun-hong Su, Xi'an Technological Univ. (China)
Wei Wang, Xi'an Technological Univ. (China)
Jun-qi Xu, Xi'an Technological Univ. (China)
Yao-jin Cheng, Science and Technology Low-Light-Level Night Vision Lab. (China)
Tao Wang, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 9281:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)

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