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Proceedings Paper

The thin mirror deformation and stress distribution analysis based on different influence functions
Author(s): Hongqiao Wang; Bin Fan; Yongqian Wu; Haitao Liu; Rong Liu
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Paper Abstract

The active support technique can be applied in the fabrication of large thin meniscus mirror. It can reduce the grinding and polishing difficulty for thin mirror. Compare between two kinds of influence function, we correct the Zernike 5th, 6th, 10th and 11th mode deformation. The low-order Zernike modes which are prone to appearing during large primary mirror processing are revised with active support technology. Influence functions are expressed with Z coordinate value and Zernike coefficient of surface shape. This paper reports that respectively adopting different influence functions to solve correction forces and the correction forces compensates specific Zernike modes of mirror deformation. After comparing the PV and RMS values of amendatory residual of surface shape, we analyze the effect of different correction forces to the biggest stress on the underside of the primary mirror. We compare the two methods based on the PV and RMS values of the residual error and the Max-stress. Gain a conclusion that correction forces obtained from Z coordinate value of surface shape is superior to the one obtained from the Zernike coefficient of surface shape.

Paper Details

Date Published: 6 August 2014
PDF: 7 pages
Proc. SPIE 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 92811W (6 August 2014); doi: 10.1117/12.2069101
Show Author Affiliations
Hongqiao Wang, Institute of Optics and Electronics (China)
Univ. of the Chinese Academy of Sciences (China)
Bin Fan, Institute of Optics and Electronics (China)
Yongqian Wu, Institute of Optics and Electronics (China)
Haitao Liu, Institute of Optics and Electronics (China)
Univ. of the Chinese Academy of Sciences (China)
Rong Liu, Institute of Optics and Electronics (China)
Univ. of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 9281:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)

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