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Proceedings Paper

Application of synchrotron radiation to semiconductor surfaces, interfaces, and heterostructures
Author(s): Massimo Altarelli
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Paper Abstract

A brief review of the main experimental techniques exploiting synchrotron radiation in semiconductor surface and interface physics is attempted. Topics emphasized include the study of surface and interface phenomena, such as structural properties (e.g. surface reconstruction) by x-ray diffraction, interface structural and dynamical properties (e.g. adsorbate vibrational amplitudes) by the x-ray standing wave technique, and the study of heterostructures by a combination of x-ray diffraction, specular reflectivity, etc. This review emphasizes brilliance (the phase-space density of photons) as the main figure of merit for many experimental techniques applicable to research in semiconductor physics. Examples of novel experiments made possible by the so-called `third generation', high-brilliance synchrotron sources are presented.

Paper Details

Date Published: 24 April 1995
PDF: 10 pages
Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); doi: 10.1117/12.206901
Show Author Affiliations
Massimo Altarelli, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 2397:
Optoelectronic Integrated Circuit Materials, Physics, and Devices
Manijeh Razeghi; Yoon-Soo Park; Gerald L. Witt, Editor(s)

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