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Proceedings Paper

InGaAs focal plane array developments and perspectives
Author(s): A. Rouvié; Jérome Coussement; O. Huet; JP. Truffer; Maxime Pozzi; E. H. Oubensaid; S. Hamard; P. Maillart; E. Costard
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Paper Abstract

Thanks to the various developments presently available, SWIR technology presents a growing interest and gives the opportunity to address a large spectrum of applications such as defense and security (night vision, active imaging), space (earth observation), transport (automotive safety) or industry (non destructive process control). InGaAs material, initially developed for telecommunications detectors, appears as a good candidate to satisfy SWIR detection needs. The lattice matching with InP constitutes a double advantage to this material: attractive production capacity and uncooled operation thanks to low dark current level induced by high quality material. In the context of this evolving domain, the InGaAs imagery activities from III-VLab were transferred to Sofradir, which provides a framework for the production activity with the manufacturing of high performances products: CACTUS320 and CACTUS640. The developments towards VGA format with 15μm pixel pitch, lead today to the industrialization of a new product: SNAKE SW. On one side, the InGaAs detection array presents high performances in terms of dark current and quantum efficiency. On the other side, the low noise ROIC has different additional functionalities. Then this 640x512 @ 15μm module appears as well suited to answer the needs of a wide range of applications. In this paper, we will present the Sofradir InGaAs technology, the performances of our last product SNAKE SW and the perspectives of InGaAs new developments.

Paper Details

Date Published: 7 October 2014
PDF: 8 pages
Proc. SPIE 9249, Electro-Optical and Infrared Systems: Technology and Applications XI, 92490Z (7 October 2014); doi: 10.1117/12.2068720
Show Author Affiliations
A. Rouvié, SOFRADIR (France)
Jérome Coussement, SOFRADIR (France)
O. Huet, SOFRADIR (France)
JP. Truffer, SOFRADIR (France)
Maxime Pozzi, SOFRADIR (France)
E. H. Oubensaid, SOFRADIR (France)
S. Hamard, SOFRADIR (France)
P. Maillart, SOFRADIR (France)
E. Costard, SOFRADIR (France)


Published in SPIE Proceedings Vol. 9249:
Electro-Optical and Infrared Systems: Technology and Applications XI
David A. Huckridge; Reinhard Ebert, Editor(s)

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