Share Email Print
cover

Proceedings Paper

Optical characterization and dimension determination of polyaniline films
Author(s): Dang Mo; Yongyao Lin; Hui Z. Wang; Zhaoxian Yu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ellipsometric spectra of insulating and conducting polyaniline films have been measured in the wave-length range of 300 nm - 800 nm. The dielectric function and the refractive index of various polyaniline films have been determined. Two absorption bands of the insulating polyaniline correspond to the interband transition and the exciton transition. More band structures in the spectrum of conducting polyaniline have been discussed and identified to the polaron transitions. The values of refractive index are between 1.31 and 1.64 for the insulating films, and between 1.37 and 1.57 for the high-conducting films. The nonlinear optical coefficient has been determined by the time-resolved absorption saturation measurement and the Z-scan measurement. The value of third order nonlinear susceptibility up to 3 X 10-10 esu at 630 nm has been obtained. The dimensionality and the dimension crossover of these low-dimensional solids have also been studied.

Paper Details

Date Published: 24 April 1995
PDF: 6 pages
Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); doi: 10.1117/12.206860
Show Author Affiliations
Dang Mo, Zhongshan Univ. (China)
Yongyao Lin, Zhongshan Univ. (China)
Hui Z. Wang, Zhongshan Univ. (China)
Zhaoxian Yu, Zhongshan Univ. (China)


Published in SPIE Proceedings Vol. 2397:
Optoelectronic Integrated Circuit Materials, Physics, and Devices
Manijeh Razeghi; Yoon-Soo Park; Gerald L. Witt, Editor(s)

© SPIE. Terms of Use
Back to Top