Share Email Print
cover

Proceedings Paper

A simple device for measuring the spectral transmittance of lens used in InGaAs image intensifier apparatus
Author(s): Xiaofeng Bai; Hui Guo; Lei Yin; Yingping He; Zhipeng Hou; Zhuang Miao; Lei Yan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this article, in order to accurately measure the spectral transmittance of imaging lens used in InGaAs imaging apparatus, a simple device, which spectrum ranges from 400 nanometers to 2000 nanometers, based on double grating monochromator and self-collimating has been founded by using stable shortwave infrared radiant source, accurate double grating monochromator and telescope, stable silicon detector and cooled HgCdTe infrared detector. An imaging lens whose spectral transmittance has been known is measured on it. Comparing the test results to known data provided by manufacture, it is shown that the testing device founded in this article is competent to measure spectral transmittance of shortwave infrared imaging lens and which max relative deviation is no more than ±2.5%. It is worthwhile for selecting InGaAs image intensifier assembly and evaluating the quality of shortwave infrared imaging lens.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92821O (18 September 2014); doi: 10.1117/12.2068569
Show Author Affiliations
Xiaofeng Bai, Kunming Institute of Physics (China)
Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)
Hui Guo, Kunming Institute of Physics (China)
Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd (China)
Lei Yin, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)
Yingping He, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)
Zhipeng Hou, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)
Lei Yan, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Corp., Ltd. (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

© SPIE. Terms of Use
Back to Top