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Proceedings Paper

Analysis of the laser damage characteristics of a production lot
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Paper Abstract

This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample’s test data is analyzed to determine its probability of damage curve, pi(φ). The probability of damage curves are further processed to derive the defect distribution, fi(φ), for each sample. The individual fi(φ) are then examined to determine if they are likely to have come from a single parent distribution, f(φ), which represents the performance of the manufacturing process.

Paper Details

Date Published: 31 October 2014
PDF: 7 pages
Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 923724 (31 October 2014); doi: 10.1117/12.2068336
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Aerospace Systems (United States)
Lars O. Jensen, Laser Zentrum Hannover e.V. (Germany)
Detlev Ristau, Laser Zentrum Hannover e.V. (Germany)

Published in SPIE Proceedings Vol. 9237:
Laser-Induced Damage in Optical Materials: 2014
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau; Detlev Ristau, Editor(s)

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