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Proceedings Paper

Toward separation of bulk and interface defects: damage probability analysis of thin film coatings
Author(s): Linas Smalakys; Gintarė Batavičiūtė; Egidijus Pupka; Andrius Melninkaitis
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Paper Abstract

Nanosecond laser - induced damage threshold (LIDT) of dielectric coatings is limited by absorption of nanometer sized defects inherent to optics manufacturing process. Herewith theoretical and experimental efforts were made in order to characterize internal damage thresholds of defects introduced during substrate polishing and coating deposition processes. For this purpose LIDT testing was performed under UV (355 nm, 4.8 ns) irradiation on three different types of samples by varying irradiation conditions such angle of incident (0°, 45°, 56°) and polarization (s, p). Experimentally obtained damage probability curves were analyzed numerically by employing model considering relative electric field distributions and randomly distributed defect ensembles attributed to distinct manufacturing processes. An attempt is made to identify the layers with the weakest optical resistance.

Paper Details

Date Published: 4 November 2014
PDF: 10 pages
Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 92371Z (4 November 2014); doi: 10.1117/12.2068209
Show Author Affiliations
Linas Smalakys, Vilnius Univ. (Lithuania)
Gintarė Batavičiūtė, Vilnius Univ. (Lithuania)
Egidijus Pupka, Vilnius Univ. (Lithuania)
Andrius Melninkaitis, Vilnius Univ. (Lithuania)

Published in SPIE Proceedings Vol. 9237:
Laser-Induced Damage in Optical Materials: 2014
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau; Detlev Ristau, Editor(s)

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