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Proceedings Paper

Design and realization of test system for testing parallelism and jumpiness of optical axis of photoelectric equipment
Author(s): Sheng-bing Shi; Zhen-xing Chen; Shao-gang Qin; Chun-yan Song; Yun-hong Jiang
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Paper Abstract

With the development of science and technology, photoelectric equipment comprises visible system, infrared system, laser system and so on, integration, information and complication are higher than past. Parallelism and jumpiness of optical axis are important performance of photoelectric equipment,directly affect aim, ranging, orientation and so on. Jumpiness of optical axis directly affect hit precision of accurate point damage weapon, but we lack the facility which is used for testing this performance. In this paper, test system which is used fo testing parallelism and jumpiness of optical axis is devised, accurate aim isn’t necessary and data processing are digital in the course of testing parallelism, it can finish directly testing parallelism of multi-axes, aim axis and laser emission axis, parallelism of laser emission axis and laser receiving axis and first acuualizes jumpiness of optical axis of optical sighting device, it′s a universal test system.

Paper Details

Date Published: 18 September 2014
PDF: 6 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92820S (18 September 2014); doi: 10.1117/12.2068153
Show Author Affiliations
Sheng-bing Shi, Bai Cheng Ordnance Test Ctr. of China (China)
Zhen-xing Chen, Bai Cheng Ordnance Test Ctr. of China (China)
Shao-gang Qin, Bai Cheng Ordnance Test Ctr. of China (China)
Chun-yan Song, Bai Cheng Ordnance Test Ctr. of China (China)
Yun-hong Jiang, Bai Cheng Ordnance Test Ctr. of China (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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