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Proceedings Paper

Evaluation damage threshold of optical thin-film using an amplified spontaneous emission source
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Paper Abstract

An accurate evaluation method with an amplified spontaneous emission (ASE) as the irradiation source has been developed for testing thin-film damage threshold. The partial coherence of the ASE source results in a very smooth beam profile in the near-field and a uniform intensity distribution of the focal spot in the far-field. ASE is generated by an Nd: glass rod amplifier in SG-II high power laser facility, with pulse duration of 9 ns and spectral width (FWHM) of 1 nm. The damage threshold of the TiO2 high reflection film is 14.4J/cm2 using ASE as the irradiation source, about twice of 7.4 J/cm2 that tested by a laser source with the same pulse duration and central wavelength. The damage area induced by ASE is small with small-scale desquamation and a few pits, corresponding to the defect distribution of samples. Large area desquamation is observed in the area damaged by laser, as the main reason that the non-uniformity of the laser light. The ASE damage threshold leads to more accurate evaluations of the samples damage probability by reducing the influence of hot spots in the irradiation beam. Furthermore, the ASE source has a great potential in the detection of the defect distribution of the optical elements.

Paper Details

Date Published: 31 October 2014
PDF: 11 pages
Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 923729 (31 October 2014); doi: 10.1117/12.2068127
Show Author Affiliations
Qiong Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Mingying Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Zhixiang Zhang, Shanghai Institute of Optics and Fine Mechanics (China)
Yudong Yao, Shanghai Institute of Optics and Fine Mechanics (China)
Yujie Peng, Shanghai Institute of Optics and Fine Mechanics (China)
Dean Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Jianqiang Zhu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 9237:
Laser-Induced Damage in Optical Materials: 2014
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau; Detlev Ristau, Editor(s)

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