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Proceedings Paper

Three dimensional mapping of absorption defects at 355 nm for potassium dihydrogen phosphate (KDP) used in high power laser systems
Author(s): Jian Chen; Jingtao Dong; Qi Zhang; Zhouling Wu
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Paper Abstract

Potassium dihydrogen phosphate (KDP) is commonly used for frequency conversion and optical switching applications in many high-power laser systems. Such applications require high damage threshold of KDP crystals. Damage behavior of KDP has been investigated for many years, and the results show that intrinsic or extrinsic defects are responsible for highly localized absorption in KDP materials, and that in turn will cause the laser damage. In this paper, we studied the absorption properties of KDP crystals at wavelengths of 355 nm by using a three-dimensional (3D) photothermal microscope. Several 3D images of the bulk defects were obtained. The results indicated that both surface defects and bulk defects can be determined and analyzed using the 3-D photothermal microscope. Our results indicate that 3D photothermal microscopy is a powerful tool for defect characterization of optical materials for high power laser applications.

Paper Details

Date Published: 31 October 2014
PDF: 6 pages
Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 923716 (31 October 2014); doi: 10.1117/12.2068120
Show Author Affiliations
Jian Chen, ZC Optoelectronic Technologies, Ltd. (China)
Jingtao Dong, ZC Optoelectronic Technologies, Ltd. (China)
Qi Zhang, ZC Optoelectronic Technologies, Ltd. (China)
Zhouling Wu, ZC Optoelectronic Technologies, Ltd. (China)


Published in SPIE Proceedings Vol. 9237:
Laser-Induced Damage in Optical Materials: 2014
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau; Detlev Ristau, Editor(s)

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