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Proceedings Paper

Thin films characterizations to design high-reflective coatings for ultrafast high power laser systems
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Paper Abstract

Dielectrics as single layers and broadband high-reflective stacks were deposited by electron beam deposition processes compatible with 1-meter class optics. After being physically and optically characterized, samples were irradiated with several ultrafast lasers (KYW:Yb 500fs, Ti:Sa 40fs and Ti:Sa 11fs) with single and multi-pulses. The setups of the test platforms, laser-induced damage threshold investigations of intrinsic materials, dielectric multilayers and hybrid metal/dielectric multilayers and electric field intensity distributions are described.

Paper Details

Date Published: 31 October 2014
PDF: 7 pages
Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 92370J (31 October 2014); doi: 10.1117/12.2068047
Show Author Affiliations
Adrien Hervy, REOSC (France)
Aix Marseille Univ., CNRS, Centrale Marseille, Institut Fresnel (France)
Lab. d’Optique Appliqueé, ENSTA, Ecole Polytechnique, CNRS (France)
Laurent Gallais, Aix Marseille Univ., CNRS, Centrale Marseille, Institut Fresnel (France)
Daniel Mouricaud, REOSC (France)
Gilles Chériaux, Lab. pour l’Utilisation des Lasers Intenses, Ecole Polytechnique (France)
Olivier Utéza, Aix Marseille Univ., CNRS, LP3 (France)
Raphael Clady, Aix Marseille Univ., CNRS, LP3 (France)
Marc Sentis, Aix Marseille Univ., CNRS, LP3 (France)
Antoine Fréneaux, Lab. pour l’Utilisation des Lasers Intenses, Ecole Polytechnique (France)


Published in SPIE Proceedings Vol. 9237:
Laser-Induced Damage in Optical Materials: 2014
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau; Detlev Ristau, Editor(s)

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