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Proceedings Paper

Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method
Author(s): Guojin Feng; Ping Li; Yingwei He; Yu Wang; Houping Wu
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Paper Abstract

Although Ray tracing method is an effective aided design method in optical system, the uncertainty caused by this method is not very clearly. The relationship between the number of rays and uncertainty has been explored in this paper, while using the Monte Carlo algorithm in Ray tracing method. It shows that if the simulation relative deviation should be limited to 0.1%, at least 1000000 rays must be used.

Paper Details

Date Published: 21 August 2014
PDF: 4 pages
Proc. SPIE 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 92830Y (21 August 2014); doi: 10.1117/12.2068015
Show Author Affiliations
Guojin Feng, National Institute of Metrology (China)
Ping Li, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Yu Wang, National Institute of Metrology (China)
Houping Wu, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 9283:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; A. G. Poleshchuk; Song Hu, Editor(s)

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