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Proceedings Paper

Testing the spectrum of infrared emission reflected by several surfaces with a FTIR
Author(s): Xuanyu Wang; Rui Hu; Minhui Pang; Haitao Bai; Wenjie Dong
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Paper Abstract

A set of sectional FTIR is applied to study the reflecting characteristics of several surfaces to infrared emission. The standard infrared source is separated from the host of the FTIR and set in a right-angled triangle with the reflecting plate and the entrance to make the reflecting infrared emission can easily pass into the detector through the route. The reflecting infrared emission from the FTIR source is measured by the FTIR detector. The reflecting plate includes metal plate, mirror, wood block and so on. A high intensity standard infrared source cooled by air is accepted and the testing background is atmosphere. The infrared emission reflected by the plate from the standard source is tested one by one. By the experiment, mirror has a good performance to reflect infrared emission, which is much better than unpainted iron plate or painted wood block. Certainly, unpainted iron plate has stronger capacity to reflect infrared emission than painted wood block, etc. As a result, the smoother the surface is, the stronger the reflecting performance is. The reflecting performance of painted surface to infrared emission is poorer than unpainted one. The various painted surfaces have not a visible difference upon their reflecting performance to infrared emission although they are made from different materials.

Paper Details

Date Published: 18 September 2014
PDF: 6 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92821D (18 September 2014); doi: 10.1117/12.2068008
Show Author Affiliations
Xuanyu Wang, Institute of NBC Defense (China)
Rui Hu, Institute of NBC Defense (China)
Minhui Pang, Institute of NBC Defense (China)
Haitao Bai, Institute of NBC Defense (China)
Wenjie Dong, Institute of NBC Defense (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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