Share Email Print
cover

Proceedings Paper

Discuss the testing problems of ultraviolet irradiance meters
Author(s): Jun'an Ye; Fangsheng Lin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ultraviolet irradiance meters are widely used in many areas such as medical treatment, epidemic prevention, energy conservation and environment protection, computers, manufacture, electronics, ageing of material and photo-electric effect, for testing ultraviolet irradiance intensity. So the accuracy of value directly affects the sterile control in hospital, treatment, the prevention level of CDC and the control accuracy of curing and aging in manufacturing industry etc. Because the display of ultraviolet irradiance meters is easy to change, in order to ensure the accuracy, it needs to be recalibrated after being used period of time. By the comparison with the standard ultraviolet irradiance meters, which are traceable to national benchmarks, we can acquire the correction factor to ensure that the instruments working under accurate status and giving the accurate measured data. This leads to an important question: what kind of testing device is more accurate and reliable? This article introduces the testing method and problems of the current testing device for ultraviolet irradiance meters. In order to solve these problems, we have developed a new three-dimensional automatic testing device. We introduce structure and working principle of this system and compare the advantages and disadvantages of two devices. In addition, we analyses the errors in the testing of ultraviolet irradiance meters.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92820V (18 September 2014); doi: 10.1117/12.2067854
Show Author Affiliations
Jun'an Ye, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

© SPIE. Terms of Use
Back to Top