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Proceedings Paper

Design of laser radar-based feature points measurement scheme
Author(s): Binggao He; Zhiyong An
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Paper Abstract

With the development of scientific technology, the requirement of aircraft level measurement technology is growing. The traditional measurement method and device have become the bottleneck of the production. The optical 3D large-size measurement technique, with the advantages of large measurement scale, high accuracy, high generality, high flexibility and automatic measurement, has becomes the primary technique for measuring the geometry of large-size object. For the actual problems existed in the routine the feature points of level measure technology, such as failure to meet required degree of accuracy, lower efficiency and slower speed of data processing, this paper puts forwards a new measuring scheme on the feature-points of aircraft level measure by using the optical measurement system of Laser radar. Initially, the measuring principle analysis has been performed based on the optical measurement system of Laser radar. The measurement scheme of the feature-points of level measure has been carried out on the basis of the principle. And then, it makes profound analysis of the key technology which includes the technology of CCD image alignment and station-moving measurement. After the actual detection, the combined error of each feature-point is less than the comprehensive error 0.3mm, meeting the measuring scheme of accuracy index. Analysis results demonstrate that design of the measuring scheme is effective, and can meet the requirements of actual applications.

Paper Details

Date Published: 18 September 2014
PDF: 8 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928204 (18 September 2014); doi: 10.1117/12.2067601
Show Author Affiliations
Binggao He, Changchun Univ. of Science and Technology (China)
Changchun Univ. (China)
Zhiyong An, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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