Share Email Print
cover

Proceedings Paper

Effects of thermal annealing on photoluminescence spectra in π-conjugated polymer film: evidence for dual emission by temperature dependent measurements
Author(s): R. Z. Wang; X. Yang; Y.C. Wang; C.-X. Sheng; Q. Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Various spectroscopy techniques such as absorption, photoluminescence and photoinduced absorption (PIA) spectroscopy, were used to study the photophysics in poly [2-methoxy-5-(20-ethyl-hexyloxy)-1, 4-phenylenevinylene] (MEH-PPV) films, which were dropped cast on glass substrates using its toluene solution and being annealed at various temperatures. With the analysis of temperature dependence PL intensities, we conclude that PL emission around 680 nm at low temperature is due to intertain excimers instead of intrachain excitons for 450 K annealed film;On the other hand, this relative intensity difference is much smaller in both unannealed and 500 K annealed films, in which the morphology is amorphous and microcrystalline, respectively. We conclude that the interchain photoexcitations play crucial roles in the photophysics of MEH-PPV films. The further measurements on PIA spectrum of MEH-PPV films suggest that the interchain photoexciation is also important for the generation of triplet excitons.

Paper Details

Date Published: 2 September 2014
PDF: 7 pages
Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 92840U (2 September 2014); doi: 10.1117/12.2067576
Show Author Affiliations
R. Z. Wang, Nanjing Univ. of Science and Technology (China)
X. Yang, Nanjing Univ. of Science and Technology (China)
Y.C. Wang, Nanjing Univ. of Science and Technology (China)
C.-X. Sheng, Nanjing Univ. of Science and Technology (China)
Q. Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9284:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
Yadong Jiang; Junsheng Yu; Bernard Kippelen, Editor(s)

© SPIE. Terms of Use
Back to Top