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Proceedings Paper

Photoluminescence defects on subsurface layer of fused silica and its effects on laser damage performance
Author(s): Hongjie Liu; Jin Huang; Fengrui Wang; Xinda Zhou; Xiaodong Jiang; Weidong Wu; Wanguo Zheng
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Paper Abstract

Subsurface defects of polished fused silica optics are responsible for igniting laser damage in high power laser system. A non destructive measurement technique is developed to detect subsurface photoluminescence defects of fused silica. The fused silica samples polished by different vendors are applied to characterization of subsurface defects and measurement of damage performance. Subsurface photoluminescence defects of fused silica are evaluated by confocal fluorescence microscopy system. Laser induced damage threshold and damage density are measured by 355 nm nanosecond pulse laser. The results show a great differential subsurface quality of fused silica samples. Laser induced damage performance has a good correlation with subsurface defects. This paper shows a new non destructive measurement technique to detect photoluminescence defects on the subsurface layer of polished fused silica. It is very valuable to increasing laser damage performance and improving production-manufacturing engineering of optics.

Paper Details

Date Published: 3 February 2015
PDF: 10 pages
Proc. SPIE 9255, XX International Symposium on High-Power Laser Systems and Applications 2014, 92553V (3 February 2015); doi: 10.1117/12.2067105
Show Author Affiliations
Hongjie Liu, China Academy of Engineering Physics (China)
Jin Huang, China Academy of Engineering Physics (China)
Fengrui Wang, China Academy of Engineering Physics (China)
Xinda Zhou, China Academy of Engineering Physics (China)
Xiaodong Jiang, China Academy of Engineering Physics (China)
Weidong Wu, China Academy of Engineering Physics (China)
Wanguo Zheng, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 9255:
XX International Symposium on High-Power Laser Systems and Applications 2014
Chun Tang; Shu Chen; Xiaolin Tang, Editor(s)

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