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Proceedings Paper

Further comparison of MODTRAN 5 to measured data in the UV band
Author(s): Leon Smith; Mark Richardson; Richard Ayling; Nick Barlow
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Paper Abstract

The ability to accurately model background radiation from the sun is important in understanding the operation of missile systems with ultraviolet (UV) guard channels. In theory a missile system’s UV channel detects a target’s silhouette, caused by its ‘negative contrast’ with respect to background UV radiation. The variation in background levels of UV will therefore have an effect on the operability of a missile system that utilises a UV channel. In this paper an update on the measurement and comparison of background UV-A radiation to data produced by Moderate Resolution Atmospheric Transmission 5 (MODTRAN®5) is given. In the past surface flux and radiance data calculated using MODTRAN®5 has been compared to data from the World Ozone and Ultraviolet Data Centre (WOUDC) archive, and measurements taken by the author at the Defence Academy of the UK. With the aid of spectral measurement equipment, new measurements have been made and compared with the radiance profiles produced by MODTRAN®5, including measurements made throughout both winter and summer months. Also discussed are the effects of scattering and absorption by different cloud types on the amount of radiation observed at the Earth’s surface.

Paper Details

Date Published: 7 October 2014
PDF: 15 pages
Proc. SPIE 9251, Technologies for Optical Countermeasures XI; and High-Power Lasers 2014: Technology and Systems, 92510J (7 October 2014); doi: 10.1117/12.2067052
Show Author Affiliations
Leon Smith, Cranfield Univ. (United Kingdom)
Mark Richardson, Cranfield Univ. (United Kingdom)
Richard Ayling, Chemring Countermeasures Ltd. (United Kingdom)
Nick Barlow, Chemring Countermeasures Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 9251:
Technologies for Optical Countermeasures XI; and High-Power Lasers 2014: Technology and Systems
David H. Titterton; Willy L. Bohn; Harro Ackermann; Mark A. Richardson; Robert J. Grasso, Editor(s)

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