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Proceedings Paper

Detection and analysis of 1/f noise correlation in semiconductor laser diodes
Author(s): Hui-juan Fan; Feng-li Gao; Jun-sheng Cao; Shu-xu Guo
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Paper Abstract

In this paper, firstly we established the theoretical model of the relationship between correlation and wavelet vanishing moment of 1/f noise. Then we designed and built the 1/f noise measurement system for semiconductor laser diodes (LDs). Based on this, we introduced the measurement method of low-frequency electrical noise in semiconductor LDs and the extraction process of parameters associated. The wavelet transform decorrelation calculation is applied to the time-domain of the low-frequency noise signals, and the calculation and analysis of the relation between wavelet coefficients variances and scales are completed. The experimental results show that the noise wavelet coefficient correlation E and the vanishing moment N of wavelet function satisfy the decorrelation theoretical model at some scales, which implies that the low-frequency noise signals measured from the LDs belong to 1/f noise. Besides, the wavelet coefficient variance calculation results indicate that the noise measured in the experiments is 1/f noise from another aspect. Finally we theoretically proposed a new idea of semiconductor laser 1/f noise judging based on the methods above.

Paper Details

Date Published: 18 September 2014
PDF: 6 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92820A (18 September 2014); doi: 10.1117/12.2066778
Show Author Affiliations
Hui-juan Fan, Jilin Univ. (China)
Feng-li Gao, Jilin Univ. (China)
Jun-sheng Cao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Shu-xu Guo, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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