Share Email Print
cover

Proceedings Paper

Analysis of CMOS hot carrier light sources using back-end-of-line light directing structures for improved light extraction efficiency
Author(s): Anthony F. Bulling; Petrus J. Venter; Monuko du Plessis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Light emission from silicon is possible in CMOS through hot carrier electroluminescence. Low conversion and low extraction efficiency remains a challenge. By using existing back-end-of-line interconnect structures it is possible to improve the extraction efficiency. Such light directing structures were analysed with the use of a focused ion beam and scanning electron microscope. It was found that it is possible to improve light extraction efficiency and directionality of the light sources through a combination of back-end-of-line structures and field oxide manipulation resulting in an improved optical path for emitted photon radiation. However, further analysis indicates that total internal reflections, scattering and electromagnetic absorption from the via plugs and metal interconnects in the back-end-of-line stack are some of the key contributors to the inefficient light extraction efficiency.

Paper Details

Date Published: 23 June 2014
PDF: 9 pages
Proc. SPIE 9257, Sensors, MEMS and Electro-Optical Systems, 92570N (23 June 2014); doi: 10.1117/12.2066401
Show Author Affiliations
Anthony F. Bulling, Univ. of Pretoria (South Africa)
Petrus J. Venter, Univ. of Pretoria (South Africa)
Monuko du Plessis, Univ. of Pretoria (South Africa)


Published in SPIE Proceedings Vol. 9257:
Sensors, MEMS and Electro-Optical Systems
Monuko du Plessis, Editor(s)

© SPIE. Terms of Use
Back to Top