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Proceedings Paper

Using the Hitachi SEM to engage learners and promote next generation science standards inquiry
Author(s): D. E. Menshew
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Paper Abstract

In this study participants will learn how the Hitachi TM3000 scanning electron microscope (SEM) played a central role in one school’s movement towards Next Generation Science Standards (NGSS) and promoted exceptional student engagement. The device was used to create high quality images that were used by students in a variety of lab activities including a simulated crime scene investigation focusing on developing evidence based arguments as well as a real world conservation biology study. It provided opportunities for small group and independent investigations in support of NGSS, and peer-peer mentoring. Furthermore, use of the device was documented and were included to enhance secondary students’ college and scholarship applications, all of which were successful.

Paper Details

Date Published: 16 September 2014
PDF: 7 pages
Proc. SPIE 9236, Scanning Microscopies 2014, 92360M (16 September 2014); doi: 10.1117/12.2066385
Show Author Affiliations
D. E. Menshew, James Enochs High School (United States)


Published in SPIE Proceedings Vol. 9236:
Scanning Microscopies 2014
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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