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Proceedings Paper • Open Access

Integrating electron microscopy into nanoscience and materials engineering programs
Author(s): Robert D. Cormia; Michael M. Oye; Lindsey M. Vencill; Anh Nguyen; David Skiver; Meng Shi; Yessica Torres

Paper Abstract

Preparing an effective workforce in high technology is the goal of both academic and industry training, and has been the engine that drives innovation and product development in the United States for over a century. During the last 50 years, technician training has comprised a combination of two-year academic programs, internships and apprentice training, and extensive On-the-Job Training (OJT). Recently, and especially in Silicon Valley, technicians have four-year college degrees, as well as relevant hands-on training. Characterization in general, and microscopy in particular, is an essential tool in process development, manufacturing and QA/QC, and failure analysis. Training for a broad range of skills and practice is challenging, especially for community colleges. Workforce studies (SRI/Boeing) suggest that even four year colleges often do not provide the relevant training and experience in laboratory skills, especially design of experiments and analysis of data. Companies in high-tech further report difficulty in finding skilled labor, especially with industry specific experience. Foothill College, in partnership with UCSC, SJSU, and NASA-Ames, has developed a microscopy training program embedded in a research laboratory, itself a partnership between university and government, providing hands-on experience in advanced instrumentation, experimental design and problem solving, with real-world context from small business innovators, in an environment called ‘the collaboratory’. The program builds on AFM-SEM training at Foothill, and provides affordable training in FE-SEM and TEM through a cost recovery model. In addition to instrument and engineering training, the collaboratory also supports academic and personal growth through a multiplayer social network of students, faculty, researchers, and innovators.

Paper Details

Date Published: 2 October 2014
PDF: 7 pages
Proc. SPIE 9236, Scanning Microscopies 2014, 92360N (2 October 2014); doi: 10.1117/12.2066250
Show Author Affiliations
Robert D. Cormia, Foothill College (United States)
NASA Ames Research Ctr. (United States)
Michael M. Oye, NASA Ames Research Ctr. (United States)
Univ. of California, Santa Cruz (United States)
San José State Univ. (United States)
Lindsey M. Vencill, Hitachi High Technologies America, Inc. (United States)
Anh Nguyen, Foothill College (United States)
NASA Ames Research Ctr. (United States)
David Skiver, NASA Ames Research Ctr. (United States)
San José State Univ. (United States)
Meng Shi, NASA Ames Research Ctr. (United States)
Yessica Torres, EAG Labs. (United States)


Published in SPIE Proceedings Vol. 9236:
Scanning Microscopies 2014
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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