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Proceedings Paper

Thermoelectrics (TE) used as detectors of radiation: an alternative calorimetry based on the photothermoelectric (PTE) effect
Author(s): D. Dadarlat; P. R. N. Misse; A. Maignan; E. Guilmeau; M. Depriester; M. Kuriakose; A. Hadj Sahraoui
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Paper Abstract

The recently introduced photothermoelectric (PTE) effect is proposed for investigating the dynamic thermal parameters of condensed matter samples. The front detection configuration, together with the thermal-wave resonator cavity (TWRC) method as scanning procedure, was used to measure the value of thermal effusivity. The back configuration, together with the TWRC technique and/or the chopping frequency of the incident radiation as scanning parameter, leads to the direct measurement of thermal diffusivity. Recent applications to solid (materials with different values of thermal parameters) and liquid (nanofluids) samples are summarized. The ferro-paraelectric phase transition of triglycine-sulphate (TGS) was also detected. The performances of the PTE method have been compared with those of the photopyroelectric (PPE) technique.

Paper Details

Date Published: 20 February 2015
PDF: 10 pages
Proc. SPIE 9258, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII, 92582R (20 February 2015); doi: 10.1117/12.2065491
Show Author Affiliations
D. Dadarlat, National Institute for Research and Development of Isotopic and Molecular Technologies (Romania)
P. R. N. Misse, Lab. de Cristallographie et Sciences des Matériaux, CNRS, ENSICAEN (France)
A. Maignan, Lab. de Cristallographie et Sciences des Matériaux, CNRS, ENSICAEN (France)
E. Guilmeau, Lab. de Cristallographie et Sciences des Matériaux, CNRS, ENSICAEN (France)
M. Depriester, Univ. Lille Nord de France (France)
Unité de Dynamique et Structure des Materiaux Moléculaires (France)
M. Kuriakose, Univ. Lille Nord de France (France)
Unité de Dynamique et Structure des Materiaux Moléculaires (France)
A. Hadj Sahraoui, Univ. Lille Nord de France (France)
Unité de Dynamique et Structure des Materiaux Moléculaires (France)


Published in SPIE Proceedings Vol. 9258:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII
Ionica Cristea; Marian Vladescu; Razvan Tamas, Editor(s)

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