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Proceedings Paper

Measurement of kinds of thresholds during the interaction between the laser beam and the CCD
Author(s): Xiao-Wu Ni; Jian Lu; Zhen-Hua Lin; Anzhi He
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Paper Abstract

The interaction process of laser and charge-coupled devices (CCD) having MOS structure has been analyzed in brief, and several kinds of damage thresholds have been put forward. On the basis of experimental test, the heat melting threshold, optical breakdown threshold, and direct damage threshold produced by a Q-switched Nd:YAG laser acted the CCD and laser energy threshold causing the whole device to fail have been obtained first.

Paper Details

Date Published: 10 April 1995
PDF: 5 pages
Proc. SPIE 2415, Charge-Coupled Devices and Solid State Optical Sensors V, (10 April 1995); doi: 10.1117/12.206520
Show Author Affiliations
Xiao-Wu Ni, Nanjing Univ. of Science and Technology (China)
Jian Lu, Nanjing Univ. of Science and Technology (China)
Zhen-Hua Lin, Nanjing Univ. of Science and Technology (China)
Anzhi He, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2415:
Charge-Coupled Devices and Solid State Optical Sensors V
Morley M. Blouke, Editor(s)

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