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Proceedings Paper

Radiative characteristics of high-power halogen tungsten lamp used in calibration of high-energy laser energy meter
Author(s): Ji Feng Wei; Yan Chang; Li Qun Sun; Kai Zhang; Xiao Yang Hu; Zi Jie Sha
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Paper Abstract

The calibration method using high-power halogen tungsten lamp as calibration source is very fit for calibration of high-energy laser energy meters. However, high-power halogen tungsten lamps after power-off still reserves much residual energy and continually radiates energy. The radiation efficiency of the halogen tungsten lamp after power-off can be quantitatively measured by a fast response radiation detector. The results show that the halogen tungsten lamp's radiation efficiency was improved with power-on time, but did not change under constant power-on time/energy. All the tested halogen tungsten lamps reached 89.3% of radiation efficiency at 50 s after power-on. After power-off, the residual energy in the halogen tungsten lamp gradually dropped to less than 10% of the initial radiation power, and the radiation efficiency changed with time. The final total radiation energy was decided by the halogen tungsten lamp's radiation efficiency, the radiation efficiency of residual energy, and the total energy consumption. The measuring uncertainty of total radiation energy was about 2.4% (k=2).

Paper Details

Date Published: 3 February 2015
PDF: 5 pages
Proc. SPIE 9255, XX International Symposium on High-Power Laser Systems and Applications 2014, 92554S (3 February 2015); doi: 10.1117/12.2065119
Show Author Affiliations
Ji Feng Wei, Tsinghua Univ. (China)
China Academy of Engineering Physics (China)
Yan Chang, China Academy of Engineering Physics (China)
Li Qun Sun, Tsinghua Univ. (China)
Kai Zhang, China Academy of Engineering Physics (China)
Xiao Yang Hu, China Academy of Engineering Physics (China)
Zi Jie Sha, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 9255:
XX International Symposium on High-Power Laser Systems and Applications 2014
Chun Tang; Shu Chen; Xiaolin Tang, Editor(s)

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