Share Email Print
cover

Proceedings Paper

Flow visualization of a non-contact transport device by Coanda effect
Author(s): Norihiko Iki; Hiroyuki Abe; Takashi Okada
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

AIST proposes new technology of non-contact transport device utilizing Coanda effect. A proposed non-contact transport device has a cylindrical body and circular slit for air. The air flow around non-contact device is turbulent and its flow pattern depends on the injection condition. Therefore we tried visualization of the air flow around non -contact device as the first step of PIV measurement. Several tracer particles were tried such as TiO2 particles, water droplets, potatoes starch, rice starch, corn starch. Hot-wire anemometer is employed to velocity measurement. TiO2 particles deposit inside of a slit and clogging of a slit occurs frequently. Potato starch particles do not clog a slit but they are too heavy to trace slow flow area. Water droplets by ultrasonic atomization also deposit inside of slit but they are useful to visualize flow pattern around a non-contact transport device by being supplied from circumference. Coanda effect of proposed non-contact transport device was confirmed and injected air flow pattern switches by a work. Air flow around non-contact trance port device is turbulent and its velocity range is wide. Therefore flow measurement by tracer part icle has traceability issue. Suitable tracer and exposure condition depends on target area.

Paper Details

Date Published: 6 August 2014
PDF: 6 pages
Proc. SPIE 9232, International Conference on Optical Particle Characterization (OPC 2014), 92320O (6 August 2014); doi: 10.1117/12.2064523
Show Author Affiliations
Norihiko Iki, National Institute of Advanced Industrial Science and Technology (Japan)
Hiroyuki Abe, National Institute of Advanced Industrial Science and Technology (Japan)
Takashi Okada, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 9232:
International Conference on Optical Particle Characterization (OPC 2014)
Nobuhiro Aya; Norihiko Iki; Tsutomu Shimura; Tomohiro Shirai, Editor(s)

© SPIE. Terms of Use
Back to Top