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Proton and neutron radiation hardness of GaN optoelectronic devices
Author(s): Ke-Xun Sun
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Date Published:
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Proc. SPIE 9215, Radiation Detectors: Systems and Applications XV, 921507; doi: 10.1117/12.2064514
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Ke-Xun Sun, Univ. of Nevada, Las Vegas (United States)


Published in SPIE Proceedings Vol. 9215:
Radiation Detectors: Systems and Applications XV
Gary P. Grim; H. Bradford Barber, Editor(s)

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