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Proceedings Paper

Analysis of surfaces, films, and multilayers by resonant laser ablation
Author(s): T. M. Allen; C. H. Smith; Peter B. Kelly; John E. Anderson; Gregory C. Eiden; A. W. Garrett; C. G. Gill; P. H. Hemberger; Nicholas S. Nogar
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Paper Abstract

In this manuscript we review briefly the history of Resonant Laser Ablation (RLA), and discuss some current ideas regarding sample preparation, laser parameters, and mechanisms. We also discuss current applications including spectral analysis of trace components, depth profiling of thin films and multilayer structures, and the use of RLA with the Ion Trap Mass Spectrometer (ITMS).

Paper Details

Date Published: 7 April 1995
PDF: 12 pages
Proc. SPIE 2385, Advanced Optical Methods for Ultrasensitive Detection, (7 April 1995); doi: 10.1117/12.206451
Show Author Affiliations
T. M. Allen, Univ. of California/Davis (United States)
C. H. Smith, Univ. of California/Davis (United States)
Peter B. Kelly, Univ. of California/Davis (United States)
John E. Anderson, Los Alamos National Lab. (United States)
Gregory C. Eiden, Los Alamos National Lab. (United States)
A. W. Garrett, Los Alamos National Lab. (United States)
C. G. Gill, Los Alamos National Lab. (United States)
P. H. Hemberger, Los Alamos National Lab. (United States)
Nicholas S. Nogar, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 2385:
Advanced Optical Methods for Ultrasensitive Detection
Bryan L. Fearey, Editor(s)

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