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Proceedings Paper

Nonlinear optical microscopy for imaging thin films and surfaces
Author(s): Laura B. Smilowitz; Duncan W. McBranch; Jeanne M. Robinson
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Paper Abstract

We have used the inherent surface sensitivity of second harmonic generation to develop an instrument for nonlinear optical microscopy of surfaces and interfaces. We have demonstrated the use of several nonlinear optical responses for imaging thin films. The second harmonic response of a thin film of C60 has been used to image patterned films. Two photon absorption light induced fluorescence has been used to image patterned thin films of Rhodamine 6G. Applications of nonlinear optical microscopy include the imaging of charge injection and photoinduced charge transfer between layers in semiconductor heterojunction devices as well as across membranes in biological systems.

Paper Details

Date Published: 7 April 1995
PDF: 12 pages
Proc. SPIE 2385, Advanced Optical Methods for Ultrasensitive Detection, (7 April 1995); doi: 10.1117/12.206445
Show Author Affiliations
Laura B. Smilowitz, Los Alamos National Lab. (United States)
Duncan W. McBranch, Los Alamos National Lab. (United States)
Jeanne M. Robinson, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 2385:
Advanced Optical Methods for Ultrasensitive Detection
Bryan L. Fearey, Editor(s)

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