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Proceedings Paper

Scintillator efficiency study with MeV x-rays
Author(s): Stuart Baker; Kristina Brown; Alden Curtis; Stephen S. Lutz; Russell Howe; Robert Malone; Stephen Mitchell; Jeremy Danielson; Todd Haines; Kris Kwiatkowski
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Paper Abstract

We have investigated scintillator efficiency for MeV radiographic imaging. This paper discusses the modeled detection efficiency and measured brightness of a number of scintillator materials. An optical imaging camera records images of scintillator emission excited by a pulsed x-ray machine. The efficiency of various thicknesses of monolithic LYSO:Ce (cerium-doped lutetium yttrium orthosilicate) are being studied to understand brightness and resolution trade-offs compared with a range of micro-columnar CsI:Tl (thallium-doped cesium iodide) scintillator screens. The micro-columnar scintillator structure apparently provides an optical gain mechanism that results in brighter signals from thinner samples. The trade-offs for brightness versus resolution in monolithic scintillators is straightforward. For higher-energy x-rays, thicker materials generally produce brighter signal due to x-ray absorption and the optical emission properties of the material. However, as scintillator thickness is increased, detector blur begins to dominate imaging system resolution due to the volume image generated in the scintillator thickness and the depth of field of the imaging system. We employ a telecentric optical relay lens to image the scintillator onto a recording CCD camera. The telecentric lens helps provide sharp focus through thicker-volume emitting scintillators. Stray light from scintillator emission can also affect the image scene contrast. We have applied an optical light scatter model to the imaging system to minimize scatter sources and maximize scene contrasts.

Paper Details

Date Published: 5 September 2014
PDF: 10 pages
Proc. SPIE 9213, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI, 92130H (5 September 2014); doi: 10.1117/12.2064028
Show Author Affiliations
Stuart Baker, National Security Technologies, LLC (United States)
Kristina Brown, National Security Technologies, LLC (United States)
Alden Curtis, National Security Technologies, LLC (United States)
Stephen S. Lutz, National Security Technologies, LLC (United States)
Russell Howe, National Security Technologies, LLC (United States)
Robert Malone, National Security Technologies, LLC (United States)
Stephen Mitchell, National Security Technologies, LLC (United States)
Jeremy Danielson, Los Alamos National Lab. (United States)
Todd Haines, Los Alamos National Lab. (United States)
Kris Kwiatkowski, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 9213:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI
Arnold Burger; Larry Franks; Ralph B. James; Michael Fiederle, Editor(s)

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