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Proceedings Paper

A review of manufacturing metrology for improved reliability of silicon photovoltaic modules
Author(s): Kristopher O. Davis; Joseph Walters; Eric Schneller; Hubert Seigneur; R. Paul Brooker; Giuseppe Scardera; Marianne P. Rodgers; Nahid Mohajeri; Narendra Shiradkar; Neelkanth G. Dhere; John Wohlgemuth; Andrew C. Rudack; Winston V. Schoenfeld
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Paper Abstract

In this work, the use of manufacturing metrology across the supply chain to improve crystalline silicon (c-Si) photovoltaic (PV) module reliability and durability is addressed. Additionally, an overview and summary of a recent extensive literature survey of relevant measurement techniques aimed at reducing or eliminating the probability of field failures is presented. An assessment of potential gaps is also given, wherein the PV community could benefit from new research and demonstration efforts. This review is divided into three primary areas representing different parts of the c-Si PV supply chain: (1) feedstock production, crystallization and wafering; (2) cell manufacturing; and (3) module manufacturing.

Paper Details

Date Published: 8 October 2014
PDF: 5 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790Y (8 October 2014); doi: 10.1117/12.2063781
Show Author Affiliations
Kristopher O. Davis, U.S. Photovoltaic Manufacturing Consortium (United States)
Univ. of Central Florida (United States)
CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Joseph Walters, U.S. Photovoltaic Manufacturing Consortium (United States)
Univ. of Central Florida (United States)
Eric Schneller, U.S. Photovoltaic Manufacturing Consortium (United States)
Univ. of Central Florida (United States)
Hubert Seigneur, U.S. Photovoltaic Manufacturing Consortium (United States)
Univ. of Central Florida (United States)
R. Paul Brooker, U.S. Photovoltaic Manufacturing Consortium (United States)
Giuseppe Scardera, DuPont Silicon Valley Technology Ctr. (United States)
Marianne P. Rodgers, Wind Energy Institute of Canada (Canada)
Nahid Mohajeri, Univ. of Central Florida (United States)
Narendra Shiradkar, Univ. of Central Florida (United States)
Neelkanth G. Dhere, Univ. of Central Florida (United States)
John Wohlgemuth, National Renewable Energy Lab. (United States)
Andrew C. Rudack, U.S. Photovoltaic Manufacturing Consortium (United States)
SEMATECH Inc. (United States)
Winston V. Schoenfeld, U.S. Photovoltaic Manufacturing Consortium (United States)
Univ. of Central Florida (United States)
CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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