Share Email Print
cover

Proceedings Paper

Characterization of thin HPHT IIa diamond by transmission and reflection measurements
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

X-ray transmission properties of a thin HPHT IIa diamond crystal were characterized around Bragg diffraction, using a pseudo plane-wave setup at the 1-km beamline of SPring-8. Monochromatic x-rays of 19.75 keV were used for diamond 400 reflection from 120-μm-thick (001) diamond crystals, and 9.44-keV x-rays were used for diamond 111 reflection from 180-μm-thick (111) crystals. These thin crystals were mounted on the aluminum plate using an ultraviolet-cured resin. Several thin crystals showed rocking curve broadening due to bend. However, by limiting a small area of the crystal, transmittance curves agreed well with those of calculation. We can select a practically usable region for various applications: phase retarder, beam splitter, and also self-seeding of x-ray free electron laser.

Paper Details

Date Published: 5 September 2014
PDF: 6 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070O (5 September 2014); doi: 10.1117/12.2063594
Show Author Affiliations
Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)
Hiroshi Yamazaki, Japan Synchrotron Radiation Research Institute (Japan)
Ayumi Miura, Toyama Co., Ltd. (Japan)
Kenji Doi, Toyama Co., Ltd. (Japan)
Yuichi Inubushi, Japan Synchrotron Radiation Research Institute (Japan)
Haruhiko Ohashi, Japan Synchrotron Radiation Research Institute (Japan)
Makina Yabashi, RIKEN (Japan)


Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

© SPIE. Terms of Use
Back to Top