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Proceedings Paper

Experimental verification of longitudinal spatial hole burning in high-power diode lasers
Author(s): Ting Hao; Junyeob Song; Richard Liptak; Paul O. Leisher
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Paper Abstract

For high-power diode lasers, asymmetric reflectivities of facets are employed in order to improve slope efficiency. In recent years, the cavity lengths of these laser diodes have been increased to better distribute heat in order to improve output power. However, these two methods result in an inhomogeneous longitudinal profile of photon density, which leads to a non-uniform gain profile and is typically referred to as longitudinal spatial hole burning (LSHB). LSHB is believed to one of the limiting factors in scaling the output power of diode lasers. In this work, the LSHB effect is confirmed experimentally. The longitudinal photon density distribution, carrier density distribution, and gain distribution were calculated using a finite difference method to solve the spatially-varying rate equations in an 808 nm high-power diode laser. The experimental work was carried out by direct observation of spontaneous emission from a window patterned into the top contact of a 1.5 mm cavity length 808 nm diode laser. Because the spontaneous emission rate is proportional to the square of carrier density, the carrier density distribution could be measured for the device. The non-uniformity observed in this device agrees with the calculated carrier density profile, strongly supporting the existence of the LSHB effect in the device.

Paper Details

Date Published: 9 June 2014
PDF: 9 pages
Proc. SPIE 9081, Laser Technology for Defense and Security X, 90810U (9 June 2014); doi: 10.1117/12.2063571
Show Author Affiliations
Ting Hao, Rose-Hulman Institute of Technology (United States)
Junyeob Song, Rose-Hulman Institute of Technology (United States)
Richard Liptak, Rose-Hulman Institute of Technology (United States)
Paul O. Leisher, Rose-Hulman Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9081:
Laser Technology for Defense and Security X
Mark Dubinskii; Stephen G. Post, Editor(s)

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