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Proceedings Paper

Junction box wiring and connector durability issues in photovoltaic modules
Author(s): Juris Kalejs
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Paper Abstract

We report here on Photovoltaic (PV) module durability issues associated with junction boxes which are under study in Task 10 of the International PV Quality Assurance Task Force (PVQAT). A number of failure modes are being identified in junction boxes in PV arrays in the field which have less than 5 years outdoor operation. Observed failure modes include melted contacts and plastic walls in the junction boxes, separated external connectors and broken latches. Standard IEC and UL tests for modules are designed to expose early mortality failures due to materials selection and design in the assembled module and their impact on performance and safety. Test standards for individual junction box components, when not part of a PV module, are still in development. We will give an overview of the reported field failures associated with junction boxes, and examine standard development as it may impact on testing for durability of junction box connectors over a 25 year life.

Paper Details

Date Published: 8 October 2014
PDF: 6 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790S (8 October 2014); doi: 10.1117/12.2063488
Show Author Affiliations
Juris Kalejs, American Capital Energy (United States)


Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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