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Proceedings Paper

High-resolution single-shot spectral monitoring of hard XFEL radiation
Author(s): Mikako Makita; Petri Karvinen; Diling Zhu; Jan Grünert; Sebastian Cartier; Yiping Feng; Julia H. Jungmann; Pavle Juranic; Henrik T. Lemke; Aldo Mozzanica; Silke Nelson; Luc Patthey; Marcin Sikorski; Sanghoon Song; Christian David
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Paper Details

Date Published:
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Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921008; doi: 10.1117/12.2063419
Show Author Affiliations
Mikako Makita, Paul Scherrer Institut (Switzerland)
Petri Karvinen, Paul Scherrer Institut (Switzerland)
Diling Zhu, SLAC National Accelerator Lab. (United States)
Jan Grünert, European XFEL GmbH (Germany)
Sebastian Cartier, Paul Scherrer Institut (Switzerland)
Yiping Feng, SLAC National Accelerator Lab. (United States)
Julia H. Jungmann, Paul Scherrer Institut (Switzerland)
Pavle Juranic, Paul Scherrer Institut (Switzerland)
Henrik T. Lemke, SLAC National Accelerator Lab. (United States)
Aldo Mozzanica, Paul Scherrer Institut (Switzerland)
Silke Nelson, SLAC National Accelerator Lab. (United States)
Luc Patthey, Paul Scherrer Institut (Switzerland)
Marcin Sikorski, SLAC National Accelerator Lab. (United States)
Sanghoon Song, SLAC National Accelerator Lab. (United States)
Christian David, Paul Scherrer Institut (Switzerland)


Published in SPIE Proceedings Vol. 9210:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Stefan P. Hau-Riege; Stefan P. Moeller; Makina Yabashi, Editor(s)

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