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Proceedings Paper

Simultaneous determination of thickness and refractive indices of birefringent wafer by simple transmission measurement
Author(s): Hee Joo Choi; Jun Yeol Ryu; Myoungsik Cha
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Paper Abstract

We demonstrate a method for determining the principal indices of refraction and the thickness of a birefringent wafer. Simply, the light transmittance was measured while rotating the wafer. The directly transmitted beam makes interference with those multiply reflected between the surfaces as in a Fabry-Pérot etalon, producing an interferogram as a function of angle of incidence. We applied this method to a LiNbO3 wafer, determining the absolute values of ordinary and extraordinary indices with an uncertainty of 10-5. In addition to the measurement accuracy, the major advantages of our method are extreme simplicity and environmental robustness in the experiment.

Paper Details

Date Published: 18 August 2014
PDF: 6 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 920309 (18 August 2014); doi: 10.1117/12.2063280
Show Author Affiliations
Hee Joo Choi, Pusan National Univ. (Korea, Republic of)
Jun Yeol Ryu, Pusan National Univ. (Korea, Republic of)
Myoungsik Cha, Pusan National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)

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