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Proceedings Paper

High brightness electron sources for MeV ultrafast diffraction and microscopy
Author(s): P. Musumeci; R. K. Li
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Paper Abstract

In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.

Paper Details

Date Published: 5 September 2014
PDF: 5 pages
Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); doi: 10.1117/12.2062997
Show Author Affiliations
P. Musumeci, Univ. of California, Los Angeles (United States)
R. K. Li, SLAC National Accelerator Lab. (United States)

Published in SPIE Proceedings Vol. 9198:
Ultrafast Nonlinear Imaging and Spectroscopy II
Zhiwen Liu, Editor(s)

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