Share Email Print
cover

Proceedings Paper

High brightness electron sources for MeV ultrafast diffraction and microscopy
Author(s): P. Musumeci; R. K. Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.

Paper Details

Date Published: 5 September 2014
PDF: 5 pages
Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); doi: 10.1117/12.2062997
Show Author Affiliations
P. Musumeci, Univ. of California, Los Angeles (United States)
R. K. Li, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 9198:
Ultrafast Nonlinear Imaging and Spectroscopy II
Zhiwen Liu, Editor(s)

© SPIE. Terms of Use
Back to Top