Share Email Print
cover

Proceedings Paper

Temperature dependent BRDF facility
Author(s): Marc B. Airola; Andrea M. Brown; Daniel V. Hahn; Michael E. Thomas; Elizabeth A. Congdon; Douglas S. Mehoke
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Applications involving space based instrumentation and aerodynamically heated surfaces often require knowledge of the bi-directional reflectance distribution function (BRDF) of an exposed surface at high temperature. Addressing this need, the Johns Hopkins University Applied Physics Laboratory (JHU/APL) developed a BRDF facility that features a multiple–port vacuum chamber, multiple laser sources covering the spectral range from the longwave infrared to the ultraviolet, imaging pyrometry and laser heated samples. Laser heating eliminates stray light that would otherwise be seen from a furnace and requires minimal sample support structure, allowing low thermal conduction loss to be obtained, which is especially important at high temperatures. The goal is to measure the BRDF of ceramic-coated surfaces at temperatures in excess of 1000°C in a low background environment. Most ceramic samples are near blackbody in the longwave infrared, thus pyrometry using a LWIR camera can be very effective and accurate.

Paper Details

Date Published: 5 September 2014
PDF: 10 pages
Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 920503 (5 September 2014); doi: 10.1117/12.2062838
Show Author Affiliations
Marc B. Airola, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Andrea M. Brown, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Daniel V. Hahn, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Michael E. Thomas, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Elizabeth A. Congdon, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Douglas S. Mehoke, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)


Published in SPIE Proceedings Vol. 9205:
Reflection, Scattering, and Diffraction from Surfaces IV
Leonard M. Hanssen, Editor(s)

© SPIE. Terms of Use
Back to Top