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Proceedings Paper

Development of single grating x-ray Talbot interferometer as a feedback loop sensor element of an adaptive x-ray mirror system
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Paper Abstract

The initial result of using a single 2-D checkerboard phase-grating Talbot interferometer as a feed-back loop sensor element of an adaptive x-ray mirror system is reported. The test was performed by measuring the surface profile of a deformable Pt coated Silicon mirror at five different actuation states. The reflected beam was detected at the fractional Talbot distance of a π/2 phase grating. The measured interferograms were de-convolved using the spatial harmonic imaging technique to extract the phase and amplitude of the reflected wavefront. The wavefront was then propagated to the mirror center to retrieve the surface profile of the mirror. The activation of a single actuator was easily detected from the reconstructed surface profile of the mirror. The presented results indicate that the single phase-grating x-ray Talbot interferometer is capable of sensing nano-meter scale profile changes of an adaptive mirror.

Paper Details

Date Published: 17 September 2014
PDF: 7 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080D (17 September 2014); doi: 10.1117/12.2062460
Show Author Affiliations
Shashidhara Marathe, Argonne National Lab. (United States)
Xianbo Shi, Argonne National Lab. (United States)
Ali M. Khounsary, Illinois Institute of Technology (United States)
X-Ray Optics, Inc. (United States)
Michael J. Wojcik, Argonne National Lab. (United States)
Naresh G. Kujala, Argonne National Lab. (United States)
Albert T. Macrander, Argonne National Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)

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