Share Email Print
cover

Proceedings Paper

Dual-energy x-ray computed tomography system using an LSO-MPPC detector
Author(s): Eiichi Sato; Yasuyuki Oda; Satoshi Yamaguchi; Osahiko Hagiwara; Hiroshi Matsukiyo; Akihiro Osawa; Toshiyuki Enomoto; Manabu Watanabe; Shinya Kusachi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To develop a dual-energy X-ray CT (DE-CT) system, we have performed investigation of high-speed dual-energy photon counting using two comparators and a low-dark-counting LSO-MPPC (multipixel photon counter) detector. To measure X-ray spectra, electric charges produced in the MPPC are converted into voltages and amplified by a highspeed current-voltage amplifier, and the event pulses are sent to a multichannel analyzer. The MPPC was driven under pre-Geiger mode at an MPPC bias voltage of 70.7 V. The event pulses are sent to two high-speed comparators for selecting two threshold energies to perform DE-CT. The ED-CT is accomplished by repeated linear scans and rotations of the object, and two sets of projection curves of the object are obtained simultaneously by the linear scan. In the DECT, two different-energy tomograms are obtained simultaneously, and photon-count energy subtraction imaging was carried out.

Paper Details

Date Published: 12 September 2014
PDF: 6 pages
Proc. SPIE 9214, Medical Applications of Radiation Detectors IV, 921402 (12 September 2014); doi: 10.1117/12.2062398
Show Author Affiliations
Eiichi Sato, Iwate Medical Univ. (Japan)
Yasuyuki Oda, Iwate Medical Univ. (Japan)
Satoshi Yamaguchi, Iwate Medical Univ (Japan)
Osahiko Hagiwara, Toho Univ. (Japan)
Hiroshi Matsukiyo, Toho Univ. (Japan)
Akihiro Osawa, Toho Univ. (Japan)
Toshiyuki Enomoto, Toho Univ. (Japan)
Manabu Watanabe, Toho Univ. (Japan)
Shinya Kusachi, Toho Univ. (Japan)


Published in SPIE Proceedings Vol. 9214:
Medical Applications of Radiation Detectors IV
H. Bradford Barber; Lars R. Furenlid; Hans N. Roehrig, Editor(s)

© SPIE. Terms of Use
Back to Top