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Proceedings Paper

An imaging-based photometric and colorimetric measurement method for characterizing OLED panels for lighting applications
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Paper Abstract

The organic light-emitting diode (OLED) has demonstrated its novelty in displays and certain lighting applications. Similar to white light-emitting diode (LED) technology, it also holds the promise of saving energy. Even though the luminous efficacy values of OLED products have been steadily growing, their longevity is still not well understood. Furthermore, currently there is no industry standard for photometric and colorimetric testing, short and long term, of OLEDs. Each OLED manufacturer tests its OLED panels under different electrical and thermal conditions using different measurement methods. In this study, an imaging-based photometric and colorimetric measurement method for OLED panels was investigated. Unlike an LED that can be considered as a point source, the OLED is a large form area source. Therefore, for an area source to satisfy lighting application needs, it is important that it maintains uniform light level and color properties across the emitting surface of the panel over a long period. This study intended to develop a measurement procedure that can be used to test long-term photometric and colorimetric properties of OLED panels. The objective was to better understand how test parameters such as drive current or luminance and temperature affect the degradation rate. In addition, this study investigated whether data interpolation could allow for determination of degradation and lifetime, L70, at application conditions based on the degradation rates measured at different operating conditions.

Paper Details

Date Published: 25 September 2014
PDF: 8 pages
Proc. SPIE 9190, Thirteenth International Conference on Solid State Lighting, 91900E (25 September 2014); doi: 10.1117/12.2062262
Show Author Affiliations
Yiting Zhu, Rensselaer Polytechnic Institute (United States)
Nadarajah Narendran, Rensselaer Polytechnic Institute (United States)
Jianchuan Tan, Rensselaer Polytechnic Institute (United States)
Xi Mou, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 9190:
Thirteenth International Conference on Solid State Lighting
Matthew H. Kane; Jianzhong Jiao; Nikolaus Dietz; Jian-Jang Huang, Editor(s)

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