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Proceedings Paper

Electroluminescence imaging of Morgan Solar Inc.’s 4th generation CPV technology for in-line quality control and optical efficiency estimation
Author(s): Michael Sinclair; Pascal Dufour; Kristine Drew; Stefan Myrskog; John Paul Morgan
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Paper Abstract

An electroluminescence test for a Concentrated PV system is presented with the objective of capturing high resolution pseudo-efficiency maps that highlight optical defects in the concentrator system. Key parameters of the experimental setup and imaging system are presented. Image processing is discussed, including comparison of experimental to nominal results and the quantitative estimation of optical efficiency. Efficiency estimates are validated using measurements under a collimated solar simulator and ray-tracing software. Further validation is performed by comparison of the electroluminescence technique to direct mapping of the optical efficiency. Initial results indicate the mean estimation error for Isc is -2.4% with a standard deviation is 6.9% and a combined measurement and analysis time of less than 5 seconds per optic. An extension of this approach to in-line quality control is discussed.

Paper Details

Date Published: 7 October 2014
PDF: 8 pages
Proc. SPIE 9175, High and Low Concentrator Systems for Solar Energy Applications IX, 91750P (7 October 2014); doi: 10.1117/12.2062066
Show Author Affiliations
Michael Sinclair, Morgan Solar, Inc. (Canada)
Pascal Dufour, Morgan Solar, Inc. (Canada)
Kristine Drew, Morgan Solar, Inc. (Canada)
Stefan Myrskog, Morgan Solar, Inc. (Canada)
John Paul Morgan, Morgan Solar, Inc. (Canada)


Published in SPIE Proceedings Vol. 9175:
High and Low Concentrator Systems for Solar Energy Applications IX
Adam P. Plesniak; Candace Pfefferkorn, Editor(s)

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