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Analyzing the evolution of microstructural disorder in thermally annealed bismuth telluride nanowires using a combined STEM/CBED approach
Author(s): Kristopher J. Erickson; Steven J. Limmer; William G. Yelton; Caitlin Rochford; Michael P. Siegal; Douglas L. Medlin
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Proc. SPIE 9174, Nanoepitaxy: Materials and Devices VI, 917410; doi: 10.1117/12.2061988
Show Author Affiliations
Kristopher J. Erickson, Sandia National Labs. (United States)
Steven J. Limmer, Sandia National Labs. (United States)
William G. Yelton, Sandia National Labs. (United States)
Caitlin Rochford, Sandia National Laboratories (United States)
Michael P. Siegal, Sandia National Labs. (United States)
Douglas L. Medlin, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 9174:
Nanoepitaxy: Materials and Devices VI
Nobuhiko P. Kobayashi; A. Alec Talin; Albert V. Davydov; M. Saif Islam, Editor(s)

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