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Proceedings Paper

Assessment of VIIRS radiometric performance using vicarious calibration sites
Author(s): Sirish Uprety; Changyong Cao; Slawomir Blonski; Wenhui Wang
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Paper Abstract

Radiometric performance of satellite instruments needs to be regularly monitored to determine if there is any drift in the instrument response over time despite the calibration with the best effort. If a drift occurs, it needs to be characterized in order to keep the radiometric accuracy and stability well within the specification. Instrument gain change over time can be validated independently using many techniques such as using stable earth targets (desert, ocean, snow sites etc), inter-comparison with other well calibrated radiometers (using SNO, SNO-x), deep convective clouds (DCC), lunar observations or other methods. This study focus on using vicarious calibration sites for the assessment of radiometric performance of Suomi National Polar-Orbiting Partnership (S-NPP) Visible Infrared Imaging Radiometer Suite (VIIRS) reflective solar bands. The calibration stability is primarily analyzed by developing the top-of-atmosphere (TOA) reflectance time series over these sites. In addition, the radiometric bias relative to AQUA MODIS is estimated over these calibration sites and analyzed. The radiometric bias is quantified in terms of observed and spectral bias. The spectral characterization and bias analysis will be performed using hyperspectral measurements and radiative transfer models such as MODTRAN.

Paper Details

Date Published: 26 September 2014
PDF: 8 pages
Proc. SPIE 9218, Earth Observing Systems XIX, 92180I (26 September 2014); doi: 10.1117/12.2061855
Show Author Affiliations
Sirish Uprety, Colorado State Univ. (United States)
Changyong Cao, NOAA National Environmental Satellite, Data, and Information Service (United States)
Slawomir Blonski, Univ. of Maryland (United States)
Wenhui Wang, ERT, Inc. (United States)


Published in SPIE Proceedings Vol. 9218:
Earth Observing Systems XIX
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)

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