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Proceedings Paper

Characterization of low contrast samples and fast processes by portable x-ray tomography
Author(s): Luca Marchitto; Sultan B. Dabagov; Luigi Allocca; Dariush Hampai; Salvatore Alfuso; Andrea Liedl; Claudia Polese
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Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070W; doi: 10.1117/12.2061832
Show Author Affiliations
Luca Marchitto, Istituto Motori CNR (Italy)
Sultan B. Dabagov, Istituto Nazionale di Fisica Nucleare (Italy)
P.N. Lebedev Physical Institute (Russian Federation)
National Research Nuclear Univ. MEPhI (Russian Federation)
Luigi Allocca, Istituto Motori CNR (Italy)
Dariush Hampai, Istituto Nazionale di Fisica Nucleare (Italy)
Salvatore Alfuso, Istituto Motori CNR (Italy)
Andrea Liedl, Istituto Nazionale di Fisica Nucleare (Italy)
Claudia Polese, Istituto Nazionale di Fisica Nucleare (Italy)
Univ. degli Studi di Roma La Sapienza (Italy)


Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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