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Proceedings Paper

Graded multilayers for fully polarization resolved resonant inelastic x-ray scattering in the soft x-ray range
Author(s): C. Morawe; J.-C. Peffen; R. Supruangnet; L. Braicovich; N. B. Brookes; G. Ghiringhelli; F. Yakhou-Harris
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Paper Abstract

On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate in fully polarized mode, a polarimeter will be inserted in the instrument to measure simultaneously the energy spectra and the linear polarization. The new spectrometer works between 500 eV and 1000 eV and requires graded multilayers to optimize the energy tunability and the polarization sensitivity. The present work covers the design, the fabrication, and the characterization of the multilayers. Performance evaluations during test and commissioning experiments with soft x-rays complement the paper.

Paper Details

Date Published: 5 September 2014
PDF: 8 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070J (5 September 2014); doi: 10.1117/12.2061827
Show Author Affiliations
C. Morawe, ESRF - The European Synchrotron (France)
J.-C. Peffen, ESRF - The European Synchrotron (France)
R. Supruangnet, Synchrotron Light Research Institute (Thailand)
L. Braicovich, SPIN, Politecnico di Milano (Italy)
N. B. Brookes, ESRF - The European Synchrotron (France)
G. Ghiringhelli, SPIN, Politecnico di Milano (Italy)
F. Yakhou-Harris, ESRF - The European Synchrotron (France)


Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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